雷科股份有限公司

持續創新改善 全員追求卓越

Continuous innovation and improvement
All employees pursue excellence
  • Passive Component Industry
    Passive Component Industry
  • PCB/FPC Industry
    PCB/FPC Industry
  • Semiconductor Industry
    Semiconductor Industry
  • Optoelectronics Industry
    Optoelectronics Industry

Semiconductor Industry

Laser marking /

  • Purpose of Use
    Used in mass production lines to ensure cleaning consistency, yield, and stable production cycles, high-precision cleaning without damaging the substrate.
  • Main Purpose
    Put into mass production, improve yield, reduce cleaning time, stabilize processes.
  • Laser Module
    Uses high-stability laser source, supports custom energy curves and higher pulse repetition rates.
  • Optical System
    High-end lens + custom spot optimization, adjusted for customer probe density/angle.
  • Fixture Design
    Custom precision fixture (including angle compensation, high-precision X/Y/Z adjustment).
  • Processing Speed
    Industry's fastest line scanning method, effectively improving processing speed.
  • Software Features
    Complete interface: recipe management, point recording, history tracking, MES integration.
  • Automation Capability
    Supports full automation: Tray loading/unloading, positioning camera, AI detection of contamination points.
  • Reliability
    Designed for long-term mass production.

Product processing instruction

Other Product Description

Before Processing - Central Area Probe (High Magnification Microscope) Before Processing - Central Area Probe (High Magnification Microscope)
After Processing - Central Area Probe Cleaning Excellent. Substrate Undamaged After Processing - Central Area Probe Cleaning Excellent. Substrate Undamaged
Before Processing - Lower Right Area Probe (High Magnification Microscope) Before Processing - Lower Right Area Probe (High Magnification Microscope)
After Processing - Lower Right Area Probe Cleaning Excellent. Substrate Undamaged After Processing - Lower Right Area Probe Cleaning Excellent. Substrate Undamaged
Before Processing - Right Side Area Probe (High Magnification Microscope) Before Processing - Right Side Area Probe (High Magnification Microscope)
After Processing - Right Side Area Probe Cleaning Excellent. Substrate Undamaged After Processing - Right Side Area Probe Cleaning Excellent. Substrate Undamaged