持續創新改善 全員追求卓越
Continuous innovation and improvement
All employees pursue excellence
Cyber應用
SOLUTIONS FOR SURFACE METROLOGY
THICKNESS & THICKFILM
Controlling the thickness of electronic devices or measuring film thickness is essential.
SURFACE ROUGHNESS
Non-destructive and fast surface roughness measurement according to international standards.
TOTAL THICKNESS VARIATION (TTV)
Measure absolute thickness, thickness variation (TTV), bow and warp.
FLATNESS MEASUREMENT
Flatness measurement is required for a variety of components including wafers, optical and mechanical parts.
COPLANARITY MEASUREMENT
Our optical systems even measure materials with different reflectivities (i.e. BGA and flip chip bumps).
TRANSPARENT FILMS AND COATINGS
