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Non-contact Profilometer
Germany Cyber Technologies Vantage 1
Vantage 1
- 2D non-contact profiling system.
- Laser non-contact measurement applicable to both dry and wet films.
- 0.125um dynamic high resolution, measurement precision up to 1um.
- [Measuring]2D (y,z or x,z), Height, Height (Avg), Length, Angle, Angle (Planar), Center, Roughness, Radius (Avg, Max, RMS, Rz).
- Finely tunable final product holder.
- 【Applicable fields】
Thickness measurement of thick film printing, hybrid circuits, BGA, TAB and FLIP/CHIP, and Solder Bumping; SMT solder paste measurement; 2D size and angle measurement.
- 【Application areas】
Semiconductor industry packaging and testing, optoelectronic industry, PCBs fabrication, SMT industry, hybrid circuits, passive components.
Product Description
Other Product Description
Vantage 1
Depth of laser scribing
3D metallization measurement on solar cells
Thick-film height on hybrid circuits
Roughness of a Gold Layer
Printed Feature on a LTCC Tape
