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Non-contact Profilometer
Germany Cyber Technologies Vantage 2
Vantage 2
- Laser non-contact measurement applicable to both dry and wet products.
- Multi-points automatic measurement available with analysis result.
- 2D/3D non-contact profiling system [Measuring]2D (y,z or x,z), 3D (x,y,z), Height, Height (Avg), Length, Angle, Angle (Planar), Center, Roughness, Rz).
- 【Applicable fields】
Thickness measurement of thick film printing, hybrid circuits, SMT solder paste, uBGA, TAB, CSP, Flip/Chip, 8 Wafer Warpage.
- 【Application areas】
Semiconductor industry packaging and testing, optoelectronic industry, PCBs fabrication, SMT industry, hybrid circuits, passive components.
Product Description
Other Product Description
Vantage 2
Coplanarity of BGA components
3D metallization measurement on solar cells
Thick-film height on hybrid circuits
