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Cyber應用
Our optical systems are ideally suited for measuring transparent materials (i.e. flux or epoxy)
TRANSPARENT FILMS AND COATINGS
Transparent films or deposits such as flux or epoxy are difficult to qualify and quantify. While certain materials are invisible for microscopes or AOI systems, our measurement systems can differentiate between several surface layers.
- 【應用實例】 ct-300
Product Description
Other Product Description
TRANSPARENT FILMS AND COATINGS
TRANSPARENT FILMS AND COATINGS
- Our optical systems are ideally suited for measuring transparent materials (i.e. flux or epoxy)
LED DEVICES
LED DEVICES
- Surface of LED devices
- Measurement of multilayer films (up to 4 layers)
- Distance sensors can measure surface and thickness
FLUX DEPOSIT
FLUX DEPOSIT
- Volume, height and area measurement on transparent deposits
- Reference area can be underneath deposit or an outside area
COATINGS
COATINGS
- Contour map of coating area on an electronic component
- Thickness measurement of conformal coatings down to 2 microns
- Different interferometer types for a variety of materials
